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Conference Proceedings

1. Chemical and Structural Analysis of Nitridated Sapphire

Cho, Y. ; Rouvimov, S. ; Kim, Y. ; Liliental-Weber, Z. ; Weber, E. R.

Pub. info.:	Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.45-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	482

Conference Proceedings

2. Structural Processes in Gold-Based Metallization during the Formation of Ohmic Contacts to GaSb

Piotrowska, A. ; Kaminska, E. ; Guziewicz, M. ; Mizera, E. ; Dynowska, E. ; Lin, X. W. ; Rouvimov, S. ; Liliental-Weber, Z. ; Kwiatkowski, S.

Pub. info.:	Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.669-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	403

Conference Proceedings

3. Application Of Room-Temperature Photoluminescence For Characterizing As-Grown And Thermally Processed CZ Silicon Wafers

Kirscht, F. ; Orschel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Shabani, M. ; Buczkowski, A.

Pub. info.:	Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A.. pp.173-178, 2002. Warrendale, Pa. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	719

Conference Proceedings

4. Photoluminescence Intensity Analysis in Application To Contactless Characterization of Silicon Wafers*

Buczkowski, A. ; Orsehel, B. ; Kim, S. ; Rouvimov, S. ; Snegirev, B. ; Fletcher, M. ; Kirscht, F.

Pub. info.:	High purity silicon VII : proceedings of the international symposium. pp.299-310, 2002. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2002-20