1.

Conference Proceedings

Conference Proceedings
Stager, B. ; Gale, M. T. ; Rossi, M.
Pub. info.: Photonics in the Automobile.  pp.238-245,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5663
2.

Conference Proceedings

Conference Proceedings
Ravasio, N. ; Gargano, M. ; Quatraro, V. P. ; Rossi, M.
Pub. info.: Heterogeneous catalysis and fine chemicals II : proceedings of the 2nd international symposium, Poitiers, October 2-5, 1990.  pp.161-,  1991.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 59
3.

Conference Proceedings

Conference Proceedings
Marini, D. ; Rizzi, A. ; Rossi, M.
Pub. info.: Human vision and electronic imaging VII : 21-24 January 2002, San Jose, USA.  pp.376-384,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4662
4.

Conference Proceedings

Conference Proceedings
Prati, L. ; Rossi, M.
Pub. info.: 3rd World Congress on Oxidation Catalysis : proceedings of the 3rd World Congress on Oxidation Catalysis, San Diego, CA, U.S.A., 21-26 September 1997.  pp.509-,  1997.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 110
5.

Conference Proceedings

Conference Proceedings
Ravasio, N. ; Gargano, M. ; Rossi, M.
Pub. info.: New developments in selective oxidation : proceedings of an international symposium, Rimini, Italy, September 18-22, 1989.  pp.139-,  1990.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 55
6.

Conference Proceedings

Conference Proceedings
Scaltrito, L. ; Celasco, E. ; Porro, S. ; Ferrero, S. ; Giorgis, F. ; Pirri, C.F. ; Perrone, D. ; Meotto, U. ; Mandracci, P. ; Richieri, G. ; Merlin, L. ; Cavallini, A. ; Castaldini, A. ; Rossi, M.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1081-1084,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
7.

Conference Proceedings

Conference Proceedings
Castro, V. Di ; Gargano, M. ; Ravasio, N. ; Rossi, M.
Pub. info.: Preparation of catalysts V : scientific bases for the preparation of heterogeneous catalysts : proceedings of the fifth international symposium, Louvain-la-Neuve, September 3-6, 1990.  pp.95-,  1991.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 63
8.

Conference Proceedings

Conference Proceedings
Castaldini, A. ; Cavakoli, D. ; Cavallini, A. ; Rossi, M.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.346-356,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
9.

Conference Proceedings

Conference Proceedings
Castaldini, A. ; Cavallini, A. ; Rossi, M. ; Cocuzza, M. ; Ricciardi, C.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.745-748,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
10.

Conference Proceedings

Conference Proceedings
Castaldini, A. ; Cavalcoli, D. ; Cavallini, A. ; Rossi, M.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.346-356,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133