1.

Conference Proceedings
Conference Proceedings
1. Frequency-Resolved Surface Photo Voltage for Epi Wafer Characterization
Buczkowski,A. ; Romanowski,A. ; Kirscht,F.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes : joint proceedings of the symposia on ALTECH 99, satellite symposium to ESSDERC 99, Leuven, Belgium [and] the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.400-407,  1999.  Pennington, N.J..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3895
2.

Conference Proceedings
Conference Proceedings
2. Conductivity measurement of GaAs layers after oxygen ion bombardment
Synowiec,Z. ; Romanowski,A. ; Dabrowska-Szata,M.
Pub. info.: Metal/Nonmetal Microsystems: Physics, Technology, and Applications.  pp.166-169,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2780
3.

Conference Proceedings
Conference Proceedings
3. LBIC investigation of the dynamic behavior of trapping-recombination centers
Paszkiewicz,B. ; Romanowski,A. ; Paszkiewicz,R. ; Panek,M. ; Tlaczala,M.J. ; Andrzejewski,P.
Pub. info.: Metal/Nonmetal Microsystems: Physics, Technology, and Applications.  pp.149-152,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2780