1.

Conference Proceedings
Conference Proceedings
1. Certified Reference Materials for the Characterisation of Multifunctional Materials
Roebben, G. ; Watjen, U. ; Lamberty, A.
Pub. info.: Functionally graded materials VIII : proceedings of the 8th International Symposium on Multifunctional and Functionally Graded Materials (FGM2004) : held in Leuven, Belgium, 11-14 July 2004.  pp.635-640,  2005.  Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 492-493
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Nano-Laminate Structure Using Grazing Incidence XRD and ATR-FTIR
Zhao, C. ; DeGendt, S. ; Caymax, M ; Heyns, M ; Consier, V. ; Maes, J.W ; Roebben, G. ; Van Der Blest, O.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.252-259,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Nano-Laminate Structure Using Grazing Incidence XRD and ATR-FTIR
Zhao, C. ; DeGendt, S. ; Caymax, M. ; Heyns, M. ; Consier, V. ; Maes, J.W. ; Roebben, G. ; Van Der Biest, O.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.252-259,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
4.

Conference Proceedings
Conference Proceedings
4. Thermal Stability of High-k Layers
Zhao, C. ; Cosnier, V. ; Chen, P.J. ; Richard, O. ; Roebben, G. ; Maes, J. ; Elshocht, S.Van ; Bender, H. ; Young, E. ; Biest, O.Van Der ; Caymax, M. ; Vandervorst, W. ; Gendt, S.De ; Heyns, M.
Pub. info.: Novel materials and processes for advances CMOS : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.9-14,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 745
5.

Conference Proceedings
Conference Proceedings
5. Elastic and Anelastic. Properties of Silicon Nitride at High Temperatures by Non-Destructive Impulse Excitation
Roebben, G. ; Biest, O. Van der
Pub. info.: Nitrides and oxynitrides : proceedings of the second International Symposium on Nitrides, held in Limerick, Ireland, June 9-11, 1998.  pp.167-172,  2000.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 325-326
6.

Conference Proceedings
Conference Proceedings
6. Electropolishing for Medical Devices: Relatively New… Fascinatingly Diverse
Aslanidis, D. ; Roebben, G. ; Bruninx, J. ; Van Moorleghem, W.
Pub. info.: Shape memory materials and its applications : proceedings of the International Conference on Shape Memory and Superelastic Technologies and Shape Memory Materials (SMST-SMM 2001), held in Kunming, China, September 2 to 6 2001.  pp.169-172,  2002.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 394-395