1.

Conference Proceedings
Conference Proceedings
1. A hard x-ray KB- FZP microscope for tomography with sub-100-nm resolution [6318-53]
Rau, C. ; Crecea, V. ; Richter, C.-P. ; Peterson, K. M. ; Jemian, P. R. ; Neuhausler, U. ; Schneider, G. ; Yu, X. ; Braun, P. V. ; Chiang, T.-C. ; Robinson, I. K.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63181G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
2.

Conference Proceedings
Conference Proceedings
2. X-RAY DIFFRACTION APPLIED TO THE STUDY OF DEFECTS IN SURFACES
Robinson, I. K. ; D'Amico, K. L.
Pub. info.: Advanced photon and particle techniques for the characterization of defects in solids : symposium held November 27-29, 1984, Boston, Massachusetts, U.S.A..  pp.161-170,  1985.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 41
3.

Conference Proceedings
Conference Proceedings
3. Diffuse X-ray Scattering Study of Defects Created by keV Ion Implants in Si
Partyka, P. J. ; Averback, R. S. ; Nordlund, K. ; Robinson, I. K. ; Walko, D. ; Ehrhart, P. ; Rubia, T. Diaz de la ; Tang, M.
Pub. info.: Microstructure evolution during irradiation : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.89-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 439
4.

Conference Proceedings
Conference Proceedings
4. Antiferroelectric to Paraelectric Phase Transition in Lead Zirconate Thin Films
Fanning, D. M. ; Robinson, I. K. ; Tani, T. ; Payne, D. A.
Pub. info.: Ferroelectric thin films VII : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.511-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 541
5.

Conference Proceedings
Conference Proceedings
5. Diffuse X-ray Scattering Study of Defects Created by keV Ion Implants in Si
Partyka, P. J. ; Averback, R. S. ; Nordlund, K. ; Robinson, I. K. ; Walko, D. ; Ehrhart, P. ; Rubia, T. Diaz de la ; Tang, M.
Pub. info.: Materials modification and synthesis by ion beam processing : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.77-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 438
6.

Conference Proceedings
Conference Proceedings
6. Examination of Interface Roughening in Ion Irradiated Cu/Nb Films by Computer Simulation and by X-ray Diffraction
Prtyka, P. J. ; Averback, R. S. ; Robinson, I. K. ; Lee, Y. S. ; Flynn, C. P. ; Bellon, P.
Pub. info.: Ion-solid interactions for materials modification and processing : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.107-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 396
7.

Conference Proceedings
Conference Proceedings
7. Extrapolation of Critical Thickness of GaN Thin Films from Lattice Constant Data Using Synchrotron X-ray
Kim, Chinkyo ; Robinson, I. K. ; Myoung, Jaemin ; Shim, Kyuhwan ; Kim, Kyekyoon ; Yoo, Myung-Cheol
Pub. info.: III-Nitride, SiC, and Diamond Materials for Electronic Devices : symposium held April, 1996, San Francisco, California, U.S.A..  pp.557-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 423
8.

Conference Proceedings
Conference Proceedings
8. Convergence of phase inversion for simple crystal shapes using coherent x-ray diffraction
Williams, G. J. ; Pfeifer, M. A. ; Vartanyants, I. A. ; Robinson, I. K.
Pub. info.: Image Reconstruction from Incomplete Data III.  pp.208-217,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5562