Structural analysis of chalcogenide waveguides using Rutherford backscattering spectroscopy (RBS)
- Author(s):
Rivero,C.A. ( CREOL/Univ. of Central Florida ) Sharek,P.S. Nootz,G. Lopez,C. Richardson,K.A. Schulte,A. Irwin,R. Galstian,T. Hamel,V. Turcotte,K. Villeneuve,A. Valee,R. - Publication title:
- Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4468
- Pub. Year:
- 2001
- Page(from):
- 47
- Page(to):
- 56
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819441829 [0819441821]
- Language:
- English
- Call no.:
- P63600/4468
- Type:
- Conference Proceedings
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