1.

Conference Proceedings
Conference Proceedings
1. X-RAY DIAGNOSTICS OF LARGE-PERIOD LATTICE-MATCHED InGaAs/InP SUPERLATTICES
Vandenberg, J.M. ; Ritter, D. ; Hamm, R.A. ; Chu, S.N.G. ; Panish, M.B.
Pub. info.: Semiconductor heterostructures for photonic and electronic applications : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.103-108,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 281
2.

Conference Proceedings
Conference Proceedings
2. Direct Determination of Electron Capture in QWIPs
Maimon, S. ; Finkman, E. ; Schacham, S.E. ; Ritter, D. ; Bahir, G.
Pub. info.: Proceedings of the Fifth International Symposium on Long Wavelength Infrared Detectors and Arrays: Physics and Applications.  pp.110-115,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-33
3.

Conference Proceedings
Conference Proceedings
3. DYNAMICAL X-RAY DIFFRACTION STUDIES OF INTERFACIAL STRAIN IN SUPERLATTICES GROWN BY MOLECULAR BEAM EPITAXY
Vanderberg, J. M. ; Chu, S. N. G. ; Hamm, R. A. ; Panish, M. B. ; Ritter, D. ; Mancrander, A. T.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.141-146,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
4.

Conference Proceedings
Conference Proceedings
4. Selective area epitaxy for optoelectronic devices
Temkin, H. ; Hamm, R. A. ; Feygenson, A. ; Cotta, M. A. ; Harriott, L. R. ; Ritter, D. ; Wang, Y. L.
Pub. info.: III-V electronic and photonic device fabrication and performance : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.89-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 300
5.

Conference Proceedings
Conference Proceedings
5. Mechanisms Causing Capacity Loss on Long-Term Storage in NiMH System
Singh, D. ; Wu, T. ; Wendling, M. ; Bendale, P. ; Ware, J. ; Ritter, D. ; Zhang, L.
Pub. info.: Materials for electrochemical energy storage and conversion II--batteries, capacitors, and fuel cells : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.25-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 496
6.

Conference Proceedings
Conference Proceedings
6. Validation of Nu-Flare e-beam emulation software in a simulation environment [5853-06]
Ritter, D. ; Brooker, P. ; Lewellen, J. ; Ham, Y.-M. ; Martin, P. ; Cottle, R.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XII.  pp.52-57,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5853
7.

Conference Proceedings
Conference Proceedings
7. System architecture enhancements for high-performance retinal scanning display systems
Ng, B.S. ; Ritter, D.
Pub. info.: Helmet- and Head-Mounted Displays VIII: Technologies and Applications.  pp.296-307,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5079
8.

Conference Proceedings
Conference Proceedings
8. InP-based QWIPs for long- and mid-wavelength band detection
Bahir, G. ; Gusakov, Y. ; Maimon, S. ; Cohen, G. ; Ritter, D. ; Finkman, E.
Pub. info.: Infrared Technology and Applications XXVIII.  Part Two  pp.663-670,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4820