1.

Conference Proceedings
Conference Proceedings
1. Ion source characterization based on an array of retarding field analyzers [5963-17]
Beermann, N. ; Ehlers, H. ; Ristau, D.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59630H-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
2.

Conference Proceedings
Conference Proceedings
2. Deposition of robust multilayer mirror coatings for storage ring FEL lasing at 176nm [5963-83]
Gunster, S. ; Ristau, D. ; Trovo, M. ; Danailov, M. ; Gatto, A. ; Kaiser,N. ; Sarto, F. ; Piegari, A.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59632A-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
3.

Conference Proceedings
Conference Proceedings
3. High resolution video based inspection method for LIDT investigations of thin disc laser crystals [5963-77]
Jupe, M. ; Starke, K. ; Jensen, L. ; Madebach, H. ; Ristau, D.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.596324-596325,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
4.

Conference Proceedings
Conference Proceedings
4. Optical monitoring of rugate filters [5963-72]
Lappschies, M. ; Gortz, B. ; Ristau, D.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59631Z-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
5.

Conference Proceedings
Conference Proceedings
5. lBS deposition of dense fluoride coatings for the vacuum ultraviolet free electron laser
Gunster, S. ; Gortz, B. ; Ristau, D. ; Quesnel, E. ; Ravel, G. ; Trovo, M. ; Danailov, M.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.59630I-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
6.

Conference Proceedings
Conference Proceedings
6. Ion beam sputter coatings for laser technology (Invited Paper) [5963-39]
Ristau, D. ; Groβ, T.
Pub. info.: Advances in optical thin films II : 13-15 September 2005, Jena, Germany.  pp.596313-596313,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5963
7.

Conference Proceedings
Conference Proceedings
7. Novel compact spectrophotometer for EUV optics characterization [6317-01]
Starke, K. ; Blaschke, H. ; Jensen, L.. ; Nevas, S. ; Ristau, D. ; Lebert, R. ; Wies, C. ; Bayer, A. ; Barkusky, F. ; Mann, K.
Pub. info.: Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA.  pp.631701-631701,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6317
8.

Conference Proceedings
Conference Proceedings
8. Use of online spectrophotometric data for the characterisation of VUV coatings
Sancho-Parramon, J. ; Bosch, S. ; Ferre-Borrull, J. ; Guenster, S. ; Ristau, D.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.619-626,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
9.

Conference Proceedings
Conference Proceedings
9. Broadband optical monitoring for the deposition of complex coating designs
Lappschies, M. ; Gross, T. ; Ehlers, H. ; Ristau, D.
Pub. info.: Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France.  pp.637-645,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5250
10.

Conference Proceedings
Conference Proceedings
10. Femtosecond breakdown and pre-breakdown behavior in thin dielectric films
Mero, M. ; Liu, J. ; Sabbah, A.J. ; Zeller, J. ; Rudolph, W.G. ; Starke, K. ; Ristau, D.
Pub. info.: Commercial and biomedical applications of ultrafast lasers IV : 27-29 January 2004, San Jose, California, USA.  pp.133-145,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5340