1.

Conference Proceedings

Conference Proceedings
Khirunenko, L.I. ; Pomozov, Y.V. ; Sosnin, M.G. ; Torres, V.J.B. ; Coutinho, J.A.P. ; Jones, R. ; Abrosimov, N.V. ; Riemann, H. ; Briddon, P.R.
Pub. info.: Advanced materials forum III : proceedings of the III International Materials Symposium Materiais 2005 and XII Encontro da Sociedade Portuguesa de Materiais - SPM Universidade de Aveiro, March 20-23, Aveiro, Portugal, 2005.  pp.364-368,  2006.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 514-516
2.

Conference Proceedings

Conference Proceedings
Ltldge, A. ; Riemann, H. ; Beyer, J. ; Schurig, Th.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.573-583,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings

Conference Proceedings
Riemann, H. ; Luedge, A. ; Boettcher, K. ; Rost, H-J. ; Hallmann, B. ; Schroeder, W. ; Hensel, W. ; Schleusener, B.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.111-123,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
4.

Conference Proceedings

Conference Proceedings
Luedge, A. ; Riemann, H. ; Turschner, T. ; Muehlbauer, A. ; Muiznieks, A. ; Raming, G.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.79-84,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
5.

Conference Proceedings

Conference Proceedings
Riemann, H. ; Luedge, A. ; Hallmann, B. ; Turschner, T.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.49-57,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13
6.

Conference Proceedings

Conference Proceedings
Retsch, C.C. ; Keitel, S. ; Schulte-Schrepping, H. ; Schneider, J.R. ; Abrosimov, N.V. ; Rossolenko, S.N. ; Riemann, H.
Pub. info.: Crystal and multilayer optics : 21-22 July, 1998, San Diego, California.  pp.76-86,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3448
7.

Conference Proceedings

Conference Proceedings
Schulze, H.-J. ; Luedge, A. ; Riemann, H.
Pub. info.: ALTECH 95 : analytical techniques for semiconductor materials and process characterization II : proceedings of the Satellite Symposium to ESSDERC 95, The Hague, The Netherlands.  pp.109-120,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-30
8.

Conference Proceedings

Conference Proceedings
Wiedemann, B. ; Meyer, J.D. ; Alt, H.C, ; Riemann, H.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.83-87,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
9.

Conference Proceedings

Conference Proceedings
Shastin, V.N. ; Orlova, E.E. ; Zhukavin, R.Kh. ; Pavlov, S. G. ; Hubers, H.-W. ; Riemann, H.
Pub. info.: Towards the first silicon laser.  pp.341-350,  2003.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 93
10.

Conference Proceedings

Conference Proceedings
Wiedemann, B. ; Meyer, J.D. ; Alt, H.C. ; Riemann, H.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.83-87,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3