1.

Conference Proceedings

Conference Proceedings
Ressel, P. ; Strusny, H. ; Fritzsche, D. ; Krautle, H. ; Mause, K.
Pub. info.: Interface control of electrical, chemical, and mechanical properties : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A..  pp.177-,  1994.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 318
2.

Conference Proceedings

Conference Proceedings
Leech, P. W. ; Reeves, G. K. ; Ressel, P.
Pub. info.: Advanced interconnects and contact materials and processes for future integrated circuits : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.441-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 514
3.

Conference Proceedings

Conference Proceedings
Ressel, P. ; Wang, L. C. ; Park, M. H. ; Leech, P. W. ; Reeves, G. K. ; Kuphal, E.
Pub. info.: Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, U.S.A..  pp.577-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 427
4.

Conference Proceedings

Conference Proceedings
Leech, P. W. ; Ressel, P. ; Reeves, G. K. ; Zhou, W. ; Kuphal, E.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.419-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
5.

Conference Proceedings

Conference Proceedings
Barnard, W.O. ; Myburg, G. ; Auret, F.D. ; Ressel, P. ; Kuphal, E.
Pub. info.: Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Semiconductor Materials and the twenty-second State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXII).  pp.305-316,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-6
6.

Conference Proceedings

Conference Proceedings
Wenzel, H. ; Klehr, A. ; Braun, M. ; Bugge, F. ; Erbert, G. ; Fricke, J. ; Knauer, A. ; Ressel, P. ; Sumpf, B. ; Weyers, M. ; Trankle, G.
Pub. info.: Physics and Applications of Optoelectronic Devices.  pp.110-123,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5594
7.

Conference Proceedings

Conference Proceedings
Klehr, A. ; Braun, M. ; Bugge, F. ; Erbert, G. ; Fricke, J. ; Knauer, A. ; Ressel, P. ; Wenzel, H. ; Trankle, G.
Pub. info.: Novel In-Plane Semiconductor Lasers IV.  pp.416-425,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5738
8.

Conference Proceedings

Conference Proceedings
Erbert, G. ; Fricke, J. ; Huelsewede, R. ; Knauer, A. ; Pittroff, W. ; Ressel, P. ; Sebastian, J. ; Sumpf, B. ; Wenzel, H. ; Traenkle, G.
Pub. info.: Novel In-Plane Semiconductor Lasers II.  pp.29-38,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4995
9.

Conference Proceedings

Conference Proceedings
Sumpf, B. ; Zorn, M. ; Staske, R. ; Fricke, J. ; Ressel, P. ; Erbert, G. ; Weyers, M. ; Trankle G
Pub. info.: Novel In-Plane Semiconductor Lasers V.  pp.61330D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6133
10.

Conference Proceedings

Conference Proceedings
Klehr, A. ; Bugge, F. ; Erbert, G. ; Fricke, J. ; Knauer, A. ; Ressel, P. ; Wenzel, H. ; Trenkle, G.
Pub. info.: Novel In-Plane Semiconductor Lasers V.  pp.61330F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6133