1.

Conference Proceedings
Conference Proceedings
1. Comparison of different methods for the determination of the average UV albedo in a mountainous terrain
Weihs,P. ; Simic,S. ; Rengarajan,G. ; Laube,W. ; Mikielewicz,W.
Pub. info.: Ultraviolet ground- and space-based measurements, models, and effects : 30 July-1 August 2001, San Diego, USA.  pp.424-431,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4482
2.

Conference Proceedings
Conference Proceedings
2. Quasi-continuum analysis of phase transformations in shape memory alloys
Rengarajan,G. ; Reddy,J.N.
Pub. info.: Smart materials, structures, and MEMS : 11-14 December 1996, Bangalore, India.  pp.712-722,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3321
3.

Conference Proceedings
Conference Proceedings
3. Numerical modeling of shape memory behavior using a continuum constitutive model
Rengarajan,G. ; Kumar,R.K. ; Reddy,J.N.
Pub. info.: Smart materials, structures, and MEMS : 11-14 December 1996, Bangalore, India.  pp.830-841,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3321
4.

Conference Proceedings
Conference Proceedings
4. Effective surface albedo due to snow cover of the surrounding area
Weihs,P. ; Lenoble,J. ; Blumthaler,M. ; Seckmeyer,G. ; Philipona,R. ; Casiniere,A.De la ; Sergent,C. ; Martin,T. ; Grobner,J. ; Cabot,T. ; Masserot,D. ; Schmucki,D.A. ; Simic,S. ; Rengarajan,G.
Pub. info.: Ultraviolet ground- and space-based measurements, models, and effects : 30 July-1 August 2001, San Diego, USA.  pp.152-159,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4482