1.

Conference Proceedings
Conference Proceedings
1. CT with monochromatic synchrotron x rays and its potential in clinical research
Dilmanian,F.A. ; Wu,X.Y. ; Ren,B. ; Button,T.M. ; Chapman,L.D. ; Dobbs,J.M. ; Huang,X. ; Nickoloff,E.L. ; Parsons,E.C.,Jr. ; Petersen,M.J. ; Thomlinson,W.C. ; Zhong,Z.
Pub. info.: Developments in x-ray tomography : 28-29 July 1997, San Diego, California.  pp.25-32,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3149
2.

Conference Proceedings
Conference Proceedings
2. Tailoring the x-ray beam energy spectrum to enhance image quality of new radiography contrast agents based on Gd or other lanthanides
Dilmanian,F.A. ; Weinmann,H.-J. ; Zhong,Z. ; Bacarian,T. ; Rigon,L. ; Button,T.M. ; Ren,B. ; Wu,X.-Y. ; Zhong,N. ; Atkins,H.L.
Pub. info.: Medical Imaging 2001: Physics of Medical Imaging.  pp.417-426,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4320
3.

Conference Proceedings
Conference Proceedings
3. Design and image quality results from volumetric CT with a flat-panel imager
Ross,W. ; Basu,S. ; Edic,P.M. ; Johnson,M. ; Pfoh,A.H. ; Rao,R. ; Ren,B.
Pub. info.: Medical Imaging 2001: Physics of Medical Imaging.  pp.783-791,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4320
4.

Conference Proceedings
Conference Proceedings
4. Cone-beam volumetric CT imagers: simulations for rapid prototype system design and prediciton of image quality
Walter,D.J. ; Ren,B. ; Pfoh,A.H. ; Edic,P.M. ; Wu,X. ; LeBlanc,J.W.
Pub. info.: Medical Imaging 2001: Physics of Medical Imaging.  pp.822-827,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4320