1.

Conference Proceedings
Conference Proceedings
1. Endor and ODEPR Investigation of the Microscopic Structure of the Boron Acceptor in 6H-SiC
Reinke,J. ; Muller,R. ; Feege,M. ; Greulich-Weber,S. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.63-68,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Magnetic Circular Dichroism and Optically Detected EPR of a Vanadium Impurity in 6H-Silicon Carbide
Reinke,J. ; Weihrich,H. ; Greulich-Weber,S. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.75-80,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. EPR and ENDOR of Defects in Silicon Carbide
Spaeth,J.-M. ; Greulich-Weber,S. ; Marz,M. ; Reinke,J. ; Feege,M. ; Kalbukhova,E.N. ; Lukin,S.N.
Pub. info.: Proceedings of the 13th International Conference on Defects in Insulating Materials, ICDIM 96, July 15-19, 1996, Wake Forest University, Winston-Salem, NC 27109, USA.  pp.149-154,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 239-241