1.

Conference Proceedings
Conference Proceedings
1. Characterization and modeling of Defects in High-k Layers Through Fast Electrical Transient Measurements
Mitard, J. ; Leroux, C. ; Reimbold, G. ; Garros, X. ; Martin, F. ; Ghibaudo, G.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.73-85,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings
Conference Proceedings
2. Electrical Characterization of High k Devices: Charges and Traps Effects on Instability, Reliability and Mobility Behavior
Reimbold, G. ; Mitard, J. ; Casse, M. ; Garros, X. ; Leroux, C. ; Thevenod, L. ; Martin, F.
Pub. info.: Silicon nitride, silicon dioxide thin insulating films, and other emerging dieletrics VIII : proceedings of the international symposium.  pp.437-455,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-01
3.

Conference Proceedings
Conference Proceedings
3. Degradation and relaxation of the buried oxide in SIMOX-MOSFET's
Karmann, A. ; Reimbold, G. ; Cristoloveanu, S.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.351-356,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
4.

Conference Proceedings
Conference Proceedings
4. Reliability Characterization of Moisture-Induced Degradation of Low-K Dielectric Behavior for Advanced Interconnects
Blachier, D. ; Ionescu, A. M. ; Mondon, F. ; Mor, Y. ; Reimbold, G.
Pub. info.: Low-dielectric constant materials V : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.101-106,  1999.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 565