1.

Conference Proceedings

Conference Proceedings
Reiche,M. ; Dragoi,V. ; Alexe,M. ; Gosele,U.M. ; Thaller,E. ; Schafer,Ch ; Lindner,F.P.
Pub. info.: MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK.  pp.395-403,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4407
2.

Conference Proceedings

Conference Proceedings
Reiche,M. ; Tong,Q.-Y. ; Gosele,U. ; Heydenreich,J.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1847-1852,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings

Conference Proceedings
Reiche,M. ; Reichel,J.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.643-648,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
4.

Conference Proceedings

Conference Proceedings
Reiche,M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1529-1534,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
5.

Conference Proceedings

Conference Proceedings
Gutjahr,K. ; Reiche,M. ; Gbsele,U.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1967-1972,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201