1.

Conference Proceedings

Conference Proceedings
Boer,M.P.de ; Luck,D.L. ; Walraven,J.A. ; Redmond,J.M.
Pub. info.: Reliability, testing, and characterization of MEMS/MOEMS : 22-24 October 2001, San Trancisco, USA.  pp.169-180,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4558
2.

Conference Proceedings

Conference Proceedings
Redmond,J.M. ; Barney,P. ; Smith,D.
Pub. info.: Smart structures and materials 1997 : industrial and commercial applications of smart structures technologies : 4-6 March 1997, San Diego, California.  pp.295-306,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3044
3.

Conference Proceedings

Conference Proceedings
Giurgiutiu,V. ; Redmond,J.M. ; Roach,D.P. ; Rackow,K.
Pub. info.: Smart structures and materials 2000 : Smart structures and integrated systems : 6-9 March, 2000, Newport Beach, USA.  pp.294-305,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3985
4.

Conference Proceedings

Conference Proceedings
Segalman,D.J. ; Redmond,J.M.
Pub. info.: Smart structures and materials 1996 : Industrial and commercial applications of smart structures technologies : 27-29 February 1996, San Diego, California.  pp.353-363,  1996.  Bellingham.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2721
5.

Conference Proceedings

Conference Proceedings
Redmond,J.M. ; Barney,P. ; Smith,T.G. ; Darnold,J.R.
Pub. info.: Process, Equipment, and Materials Control in Integrated Circuit Manufacturing IV.  pp.54-60,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3507
6.

Conference Proceedings

Conference Proceedings
de Boer,M.P. ; Redmond,J.M. ; Michalske,T.A.
Pub. info.: Materials and Device Characterization in Micromachining.  pp.241-250,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3512