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Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA. pp.1050-1059, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mayavaram, R. ; Reddy, M. ; Stewart, D. ; Tolle, J.
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ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.2356-2360, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Mayavaram, R. ; Reddy, M. ; Stewart, D. ; Tolle, J.
Pub. info.:
ANTEC 2000 Conference proceedings, May 7-11, 2000, Orlando, Florida. pp.2356-2360, 2000. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Agarwal, S. ; Reddy, M. ; Hall, R. ; Woodard, T. ; Brown, J. ; Trang, A.
Pub. info.:
Detection and remediation technologies for mines and minelike targets X : 28 March-1 April, 2005, Orlando, Florida, USA. pp.102-112, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Prineas, J.P. ; Reddy, M. ; Olesberg, J.T. ; Cao, C. ; Veerasamy, S. ; Flatte, M.E. ; Koerperick, E.J. ; Boggess, T.F. ; Santilli, M.R. ; Olafsen, L.J.
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Semiconductor photodetectors II : 25-26 January 2005, San Jose, California, USA. pp.113-121, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering