1.

Conference Proceedings
Conference Proceedings
1. Fully CMOS-compatible low-power microheater
Laconte, J. ; Dupont, C. ; Akheyar, A. ; Raskin, J.-P. ; Flandre, D.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France.  pp.634-644,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4755
2.

Conference Proceedings
Conference Proceedings
2. Figures-of-merit of Intrinsic, standard-doped and graded-channel SOt and SOS MOSFETs for analog baseband and RF applications
Levacq, D. ; Dehan, M. ; Flandre, D. ; Raskin, J.-P.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.295-300,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
3.

Conference Proceedings
Conference Proceedings
3. Partially depleted SOIt dynamic-threshold MOSFET for low-voltage and microwave applications
Dehan, M. ; Raskin, J.-P. ; Vanhoenacker, D.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.289-294,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
4.

Conference Proceedings
Conference Proceedings
4. Impact of the graded-channel architecture on double gate transistors for high-performance analog applications
Pavanello, M.A. ; Martino, J.A. ; Chung, T.M. ; Kranti, A. ; Raskin, J.-P. ; Flandre, D.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.261-266,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
5.

Conference Proceedings
Conference Proceedings
5. Noise modeling and performance in 0.1 5-μm fully depleted SOI MOSFET
Pailloncy, G. ; Ihiguez, B. ; Dambrine, G. ; Dehan, M. ; Raskin, J.-P. ; Matsuhashi, H. ; Delatte, P. ; Danneville, F.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.122-130,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
6.

Conference Proceedings
Conference Proceedings
6. Optoelectronic control of coplanar transmission lines up to 110 GHz.
Stiens, J. H. ; Poesen, G. ; Koers, G. ; Simon, P. ; Raskin, J.-P. ; Huynen, I. ; De Raedt, W. ; Vounckx, R. A.
Pub. info.: Microwave and terahertz photonics : 29-30 April 2004, Strasbourg, France.  pp.101-108,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5466
7.

Conference Proceedings
Conference Proceedings
7. Behavior of Graded Channel SOI Gate-All-Around NMOSFET Devices at High Temperatures
dos Santos, C. D. G. ; Pavanello, M. A. ; Martino, J. A. ; Flandre, D. ; Raskin, J.-P.
Pub. info.: Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium.  pp.9-14,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-03
8.

Conference Proceedings
Conference Proceedings
8. Pretreatment Effects on Void Formation for Low Temperature Si-Si Bonded Wafers
Zhang, X.X. ; Raskin, J.-P.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.233-238,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-19
9.

Conference Proceedings
Conference Proceedings
9. Partially Depleted SOI Dynamic Threshold MOSFET for Low-Voltage and Microwave Applications
Dehan, M. ; Vanhoenacker-Janvier, D. ; Raskin, J.-P.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.578-583,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
10.

Conference Proceedings
Conference Proceedings
10. High-frequency noise in FDSOI MOSFETs: a Monte Carlo investigation
Rengel, R. ; Mateos, J. ; Pardo, D. ; Gonzalez, T. ; Martin, M.J. ; Dambrine, G. ; Danneville, F. ; Raskin, J.-P.
Pub. info.: Noise in Devices and Circuits.  pp.379-386,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113