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Energy levels associated with the metastable state of EL2

Author(s):
Stievenard,D.
Delerue,C.
Bremond,G.
Guillot,G.
Azoulay,R.
Bardeleben,H.J.von
Bourgoin,J.C.
Portal,J.C.
Ranz,E.
4 more
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. Year:
1992
Vol.:
Pt.2
Page(from):
911
Page(to):
916
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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