1.

Conference Proceedings
Conference Proceedings
1. Recent results on the factors govering the energy resolution in compound semiconductors to be used as future spectroscopic detectors for hard X-ray astronomy
Kraft, S. ; Peacock, T. ; Bavdaz, M. ; Owens, A. ; Gagliardi, M.-A. ; Nenonen, S. ; Scholze, F. ; Ulm, G. ; Tuomi, T. ; Juvonen, M. ; Rantamaki, R.
Pub. info.: EUV, x-ray, and gamma-ray instrumentation for astronomy IX : 22-24 July 1998 San Diego, California.  pp.236-246,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3445
2.

Conference Proceedings
Conference Proceedings
2. An Examination of the Crystalline Quality of 200-mm-Diameter Silicon Substrates Using X-ray Topography
Curley, J. ; McNally, P. J. ; Reader, A. ; Tuomi, T. ; Taskinen, M. ; Rantamaki, R. ; Danilewsky, A. ; Schropp, B.
Pub. info.: Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.83-,  1997.  Pittsburg, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 469
3.

Conference Proceedings
Conference Proceedings
3. Synchrotron X-ray Topographic Study of Dislocations in GaAs Detector Crystals Grown by Vertical Gradient Freeze Technique
Tuomi, T. ; Juvonen, M. ; Rantamaki, R. ; Hjelt, K. ; Bavdaz, M. ; Nenonen, S. ; Gagliardi, M-A. ; McNally, P. J. ; Danilewsky, A. N. ; Prieur, E. ; Taskinen, M. ; Tuominen, M.
Pub. info.: Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.459-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 487
4.

Conference Proceedings
Conference Proceedings
4. Epitaxial Lateral Overgrowth of Gallium Arsenide Studied by Synchrotron Topography
Rantamaki, R. ; Tuomi, T. ; Zytkiewicz, Z. R. ; Dobosz, D. ; McNally, P. J. ; Danilewsky, A. N.
Pub. info.: Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.181-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 570
5.

Conference Proceedings
Conference Proceedings
5. The Use of X-ray Topography to Map Mechanical, Thermomechanical, and Wire-Bond Strain Fields in Packaged Integrated Circuits
McNally, Patrick J. ; Rantamaki, R. ; Curley, John W. ; Tuomi, T. ; Danilewsky, A. N. ; Herbert, P. A. F.
Pub. info.: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.241-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 505
6.

Conference Proceedings
Conference Proceedings
6. Synchrotron X-ray topography studies of epitaxial lateral overgrowth of GaN on sapphire
McNally, P. J. ; Tuomi, T. ; Rantamaki, R. ; Jacobs, K. ; Considine, L. ; O'Hare, M. ; Lowney, D. ; Danilewsky, A. N.
Pub. info.: Wide-bandgap semiconductors for high-power, high-frequency, and high temperature applications--1999 : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.327-,  1999.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 572