1.

Conference Proceedings

Conference Proceedings
Wagner,J. ; Ramsteiner,M. ; Ashwin,M.J. ; Fahy,M.R. ; Newman,R.C. ; Braun,W. ; Ploog,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.259-264,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Wagner,J. ; Ramsteiner,M. ; Murray,R. ; Newman,R.C.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.815-820,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
3.

Conference Proceedings

Conference Proceedings
Koidl,P. ; Wild,Ch. ; Dischler,B. ; Wagner,J. ; Ramsteiner,M.
Pub. info.: Properties and characterization of amorphous carbon films.  pp.41-70,  1990.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 52-53