1.

Conference Proceedings

Conference Proceedings
Paszkiewicz,R. ; Korbutowicz,R. ; Paszkiewicz,B. ; Radziewicz,D. ; Kozlowski,J. ; Tlaczala,M.J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.61-64,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Nowaczyk-Utko,M. ; Sek,G. ; Misiewicz,J. ; Sciana,B. ; Radziewicz,D. ; Tlaczala,M.J.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.254-257,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings

Conference Proceedings
Paszkiewicz,R. ; Korbutowicz,R. ; Radziewicz,D. ; Panek,M. ; Paszkiewicz,B. ; Koztowski,J. ; Boratyrtski,B. ; Ttaczata,M.J.
Pub. info.: Epilayers and heterostructures in optoelectronics and semiconductor technology : International Conference on Solid State Crystals '98 : 12-16 October 1998, Zakopane, Poland.  pp.21-24,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3725
4.

Conference Proceedings

Conference Proceedings
Misiewicz,J. ; Ciorga,M. ; Sek,G. ; Bryja,L. ; Radziewicz,D. ; Korbutowicz,R. ; Panek,M. ; Tlaczala,M. J.
Pub. info.: Solid state crystals in optoelectronics and semiconductor technology : 7-11 October 1996, Zakopane, Poland.  pp.125-128,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3179