1.

Conference Proceedings
Conference Proceedings
1. Nonequilibrium Structures in Codeposited Cr-Fe-Ni Films
Specht, E.D. ; Rack, P.D. ; Rar, A. ; Pharr, G.M. ; George, E.P. ; Hong, H.
Pub. info.: Combinatorial and artificial intelligence methods in materials science II : symposium held December 1-4, Boston, Massachusetts, U.S.A.  pp.45-50,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 804
2.

Conference Proceedings
Conference Proceedings
2. Ultraviolet Emitting SrS:Te Thin Films
Fitz-Gerald, J.M. ; Hoekstra, J. ; Fowlkes, J.D. ; Rack, P.D.
Pub. info.: Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.119-130,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 744
3.

Conference Proceedings
Conference Proceedings
3. Deposition of Ceramic Materials Using Powder and Precursor Vehicles Via Direct Write Processing
Rack, P.D. ; Fitz-Gerald, J.M. ; Geiculescu, A.C. ; Rack, H.J. ; Pique, A. ; Auyeung, R.C.Y. ; Chrisey, D.B.
Pub. info.: Materials development for direct write technologies : symposium held April 24-26, 2000, San Francisco, California, U.S.A..  pp.29-34,  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 624
4.

Conference Proceedings
Conference Proceedings
4. Soft electron beam etching for precision TEM sample preparation
Rack, P.D. ; Thesen, A. ; Randolph, S. ; Fowlkes, J.D. ; Joy, D.C.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.943-949,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038