1.

Conference Proceedings
Conference Proceedings
1. 380b. Molecular Vapor Deposition for Enhanced Monolayer Stability and Durability
B. Kobrin ; W. Robert Ashurst ; V. Fuentes ; R. Nowak ; R. Yi
Pub. info.: 2005 annual meeting & fall showcase : '05 AIChE, Oct 30 - Nov 4 : conference proceedings, Cincinnati Convention Center, Cincinnati, OH : non-topical presentation records : 08. Materials Engineering and Sciences Division.  2005.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE Conference Proceedings
Ser. no.: P-221(2)
2.

Conference Proceedings
Conference Proceedings
2. Calibration of MCP transmissivity from 2-5.5keV
Z. Cao ; H. Li ; J. Dong ; S. Wu ; R. Yi
Pub. info.: Advances in x-ray/EUV optics and components III : 11-13 August 2008, San Diego, California, USA.  pp.70771M-1-70771M-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7077
3.

Conference Proceedings
Conference Proceedings
3. A novel quasi-digital detection method of micro differential capacitance in micro-accelerometers
X. Song ; J. Fang ; R. Yi ; W. Sheng
Pub. info.: Sensors and instruments, computer simulation, and artificial intelligence : Seventh International Symposium on Instrumentation and Control Technology : 10-13 October, 2008, Beijing, China.  pp.712716-1-712716-6,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7127
4.

Conference Proceedings
Conference Proceedings
4. Development on miniature detector for soft x-ray used in laser plasma interaction experiments
Z. Wang ; X. Tang ; R. Yi ; Q. Sun ; C. Gao
Pub. info.: Photonics and Optoelectronics Meetings (POEM) 2008 : optoelectronic devices and integration : 24-27 November 2008, Wuhan, China.  pp.72791S-1-72791S-6,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7279