1.

Conference Proceedings
Conference Proceedings
1. New NBTI Lifetime Prediction Method for Ultra Thin SiO₂ Film
K. Watanabe ; R. Kuroda ; A. Teramoto ; S. Sugawa ; T. Ohmi
Pub. info.: Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5.  pp.147-160,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(1)
2.

Conference Proceedings
Conference Proceedings
2. Hot Carrier Instability Mechanism in Accumulation-Mode Normally-off SOI nMOSFETs and Their Reliability Advantage
R. Kuroda ; A. Teramoto ; W. Cheng ; S. Sugawa ; T. Ohmi
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.113-120,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
3.

Conference Proceedings
Conference Proceedings
3. NBTI Mechanism Based on Hole-Injection for Accurate Lifetime Prediction
A. Teramoto ; R. Kuroda ; T. Ohmi
Pub. info.: Silicon nitride, silicon dioxide, and emerging dielectrics 9.  pp.229-244,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(3)