1.

Conference Proceedings
Conference Proceedings
1. A novel unsupervised anomaly detection based on robust principal component classifier [6241-29]
Qiu, W. ; Wu, Y. ; Wang, G. ; Yang, X. S. ; Bai, J. ; Li, J.
Pub. info.: Data mining, intrusion detection, information assurance, and data networks security 2006 : 17-18 April 2006, Kissimmee, Florida, USA.  pp.62410T-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6241
2.

Conference Proceedings
Conference Proceedings
2. A tunable optical delay line based on slow light [6352-04]
Zhang, Y. ; Qiu, W. ; He, T. ; Ye, J. ; Yuan, P.
Pub. info.: Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea.  pp.635204-635204,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6352
3.

Conference Proceedings
Conference Proceedings
3. Multiresolution 3D imaging with temporal sequential fringe projector
Tian, J. ; Peng, X. ; Yu, B. ; Wu, B. ; Zhang, P. ; Wei, L. ; Qiu, W.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.589-596,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
4.

Conference Proceedings
Conference Proceedings
4. Dynamic 3D profilometry with dual-acousto-optic fringe projection (Invited Paper)
Peng, X. ; Tian, J. ; Zhang, P. ; Wei, L. ; Qiu, W. ; Li, E. ; Zhang, D.
Pub. info.: Optical design and testing II : 8-12 November 2004, Beijing, China.  pp.456-463,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5638
5.

Conference Proceedings
Conference Proceedings
5. Second generation fluids for 193nm immersion lithography [6154-42]
French, R. H. ; Qiu, W. ; Yang, M. K. ; Wheland, R. C. ; Lemon, M. F. ; Shoe, A. L. ; Adelman, D. J. ; Crawford, M. K. ; Tran, H. V. ; Feldman, J. ; McLain, S. J. ; Peng, S.
Pub. info.: Optical Microlithography XIX.  pp.615415-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
6.

Conference Proceedings
Conference Proceedings
6. Alt-phase shift mask technology for 65nm logic applications [6154-22]
Chakravorty, K. K. ; Henrichs, S. ; Qiu, W. ; Chavez, J. L. ; Liu, Y.-P. ; Ghadiali, F. ; Yung, K. ; Wilcox, N. ; Silva, M. ; Ma, J. ; Wu, P. ; Irvine, B. ; Yun, H. ; Cheng, W H ; Farnsworth, J
Pub. info.: Optical Microlithography XIX.  pp.61540M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
7.

Conference Proceedings
Conference Proceedings
7. 157-nm pellicles: polymer design for transparency and lifetime
French, R.H. ; Wheland, R.C. ; Qiu, W. ; Lemon, M.F. ; Blackman, G.S. ; Zhang, E. ; Gordon, J. ; Liberman, V. ; Grenville, A. ; Kunz, R.R. ; Rothschild, M.
Pub. info.: Optical Microlithography XV.  Part One  pp.576-583,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691
8.

Conference Proceedings
Conference Proceedings
8. Single layer fluropolymer resists for 157-nm lithography
Crawford, M.K. ; Farnham, W.B. ; Feiring, A.E. ; Feldman, J. ; French, R.H. ; Leffew, K.W. ; Petrov, V.A. ; Qiu, W. ; Schadt, F.L. ; Tran, H.V. ; Wheland, R.C. ; Zumsteg, F.C. Jr.,
Pub. info.: Advances in Resist Technology and Processing XX.  1  pp.80-92,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5039