Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.118-123, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wavelet applications in signal and image processing VIII : 31 July-4 August, 2000, San Diego, USA. 4119 pp.596-604, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Exploiting new image sources and sensors : 26th AIPR Workshop, 15-17 October 1997, Washington, D.C.. pp.168-178, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Human vision and electronic imaging III : 26-29 January, 1998, San Jose, California. pp.473-481, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Medical imaging 1998, Image processing : 23-26 February 1998, San Diego, California. Part 2 pp.1168-1176, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Power-limiting materials and devices : 21-22 July 1999, Denver, Colorado. pp.140-146, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ophthalmic technologies X : 22-23 January 2000, San Jose, USA. pp.34-37, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore. pp.366-373, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore. pp.243-248, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.313-323, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering