1.

Conference Proceedings
Conference Proceedings
1. ELECTRICAL DAMAGE INTRODUCED IN GaAs BY REACTIVE ION ETCHING USING CH4/H2 MIXTURE
Collot, P. ; Gaonach, C. ; Proust, N.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.507-512,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
2.

Conference Proceedings
Conference Proceedings
2. DEPENDENCE OF a-Si:H TFTs PERFORMANCES ON DEPOSITION AND PROCESS PARAMETERS
Chartier, E. ; Szydlo, N. ; Boulitrop, F. ; Proust, N. ; Margarino, J.
Pub. info.: Semiconductor-on-insulator and thin film transistor technology : symposium held December 3-6, 1985, Boston, Massachusetts, U.S.A..  pp.453-458,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 53