1.

Conference Proceedings
Conference Proceedings
1. Growth and characterization of single crystal InAs nanowire arrays and their application to plasmonics [6370-25]
Prokes, S. M. ; Park, H. D. ; Glembocki, O. J.
Pub. info.: Nanomaterial synthesis and integration for sensors, electronics, photonics, and electro-optics : 1-4 October, 2006, Boston, Massachusetts, USA.  pp.63700Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6370
2.

Conference Proceedings
Conference Proceedings
2. DETERMINATION OF INTERMETALLIC FORMATION MECHANISM USING DIFFERENTIAL SCANNING CALORIMETRY OF MULTILAYERED THIN FILMS
Schlesinger, T. E. ; Prokes, S. M. ; Cammarata, R. C.
Pub. info.: Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.677-682,  1992.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 238
3.

Conference Proceedings
Conference Proceedings
3. In Situ Studies of the Formation of Ga and Al Wires on Si(112) Facet Surfaces
Prokes, S. M. ; Glembocki, O. J.
Pub. info.: Epitaxial growth - principles and applications : symposium held April 5-8, 1999, San Francisco, California, U.S.A..  pp.117-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 570
4.

Conference Proceedings
Conference Proceedings
4. Oxygen Related Defect Center Red Room Temperature Photoluminescence in As Made and Oxidized Porous Silicon
Prokes, S. M. ; Carlos, W. E.
Pub. info.: Surface/interface and stress effects in electronic material nanostructures : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.153-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 405
5.

Conference Proceedings
Conference Proceedings
5. *THE EFFECTS OF STRESS ON THE INTERDIFFUSION IN Si1-xGex/Si SUPERLATTICES
Prokes, S. M.
Pub. info.: Mechanical behavior of materials and structures in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.129-140,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 226
6.

Conference Proceedings
Conference Proceedings
6. A COMPARISON OF TWO EPITAXIAL FORMATION MECHANISMS IN THE SiGe SYSTEM
Prokes, S. M. ; Rai, A. K.
Pub. info.: Common themes and mechanisms of epitaxial growth : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.59-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 312
7.

Conference Proceedings
Conference Proceedings
7. STRESS AND ITS EFFECT ON INTERMIXING IN Si1-xGex/Si SUPERLATTICES
Prokes, S. M.
Pub. info.: Thin films, stresses and mechanical properties V : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.3-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 356
8.

Conference Proceedings
Conference Proceedings
8. Surface Energy Constraints for Heteroepitaxial Growth on Compliant Substrates: Morphology of GaN Grown on Sc Layers
Koleske, D. D. ; Wickenden, A. E. ; Freitas, J. A., Jr. ; Kaplan, R. ; Prokes, S. M.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.347-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449
9.

Conference Proceedings
Conference Proceedings
9. Synthesis of Si nanowires for MEMS cantilever sensor applications (Invited Paper)
Prokes, S. M. ; Arnold, S.
Pub. info.: Nanosensing: Materials and Devices.  pp.88-100,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5593