1.

Conference Proceedings

Conference Proceedings
Davidson,B.R. ; Newman,R.C. ; Pritchard,R.E. ; Robbie,D.A. ; Sangster,M.J.L. ; Wagner,J. ; Fischer,A. ; Ploog,K.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.247-252,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Pritchard,R.E. ; Ashwin,M.J. ; Newman,R.C. ; Tucker,J.H. ; Lightowlers,E.C. ; Binns,M.J. ; Falster,R. ; McQuaid,S.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.283-288,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263