1.

Conference Proceedings
Conference Proceedings
1. Simulations of a multiple-core-fiber-based interferometer in the presence of noise
Tuttle,C.E. ; Prasad,S.
Pub. info.: Astronomical Interferometry : 20-24 March 1998, Kona, Hawaii.  Part 1  pp.342-353,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3350
2.

Conference Proceedings
Conference Proceedings
2. Monolithic OEICs using GaAs VLSI technology
Ahadian,J.F. ; Patterson,S.G. ; Vaidyanathan,P.T. ; Royter,Y. ; Mull,D.E. ; Petrich,G.S. ; Goodhue,W.D. ; Prasad,S. ; Kolodziejski,L.A. ; Fonstad,C.G.,Jr.
Pub. info.: Light-Emitting Diodes: Research, Manufacturing, and Applications.  pp.180-185,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3002
3.

Conference Proceedings
Conference Proceedings
3. Ultrathin gate oxide degradation under different rates of charge injection
Mongkolkachit,P. ; Bhuva,B.L. ; Prasad,S. ; Bui,N. ; Kerns,S.E.
Pub. info.: In-Line Methods and Monitors for Process and Yield Improvement.  pp.106-111,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3884
4.

Conference Proceedings
Conference Proceedings
4. Enhanced hot-carrier-induced degradation of 0.25-jim P-MOSFETs with oxide/nitride composite spacer compared to those with oxide spacer
Janapaty,V. ; Tsai,J.T. ; Prasad,S.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV.  pp.225-228,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3510
5.

Conference Proceedings
Conference Proceedings
5. Evaluation of pad life in chemical mechanical polishing process using statistical metrology
Muthukrishnan,N.M. ; Prasad,S. ; Stine,B.E. ; Loh,W. ; Nagahara,R. ; Chung,J.E. ; Boning,D.S.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.70-79,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3216