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Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. pp.129-136, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III. pp.70-78, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering