1.
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Conference Proceedings
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Nafria, M. ; Blasco, X. ; Porti, M. ; Aguilera, L. ; Aymerich, X.
Pub. info.: |
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices. pp.435-447, 2006. Dordrecht. Springer |
Title of ser.: |
NATO science series. Series 2, Mathematics, physics and chemistry |
Ser. no.: |
220 |
|
2.
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Conference Proceedings
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Porti, M. ; Nafria, M. ; Aymerich, X.
Pub. info.: |
Nanotechnology. pp.466-473, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5118 |
|
3.
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Conference Proceedings
|
Porti, M. ; Avidano, M. ; Nafria, M. ; Aymerich, X. ; Carreras, J. ; Garrido, B.
Pub. info.: |
Nanotechnology II. pp.43-51, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5838 |
|