1.

Conference Proceedings

Conference Proceedings
Leszczynski,M. ; Prystawko,P. ; Czernecki,R. ; Lehnert,J. ; Perlin,P. ; Wisniewski,P. ; Skierbiszewski,Cz. ; Suski,T. ; Nowak,G. ; Karouta,F. ; Holst,J. ; Grzegory,I. ; Porowski,S.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  pp.11-15,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Godlewski,M. ; Ivanov,V.Yu. ; Kaminska,A. ; Zuo,H.Y. ; Goldys,E.M. ; Tansley,T.L. ; Barski,A. ; Rossner,U. ; Rouvicre,J.L. ; Arlery,M. ; Grzegory,I. ; Suski,T. ; Porowski,S. ; Bergman,J.P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1149-1154,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Jursenas,S. ; Kurilcik,G. ; Kurilcik,N. ; Tamulaitis,G. ; Kazlauskas,K. ; Zukauskas,A. ; Prystawko,P. ; Leszczynski,M. ; Suski,T. ; Perlin,P. ; Grzegory,I. ; Porowski,S.
Pub. info.: Smart optical inorganic structures and devices : 16-19 August 2000, Vilnius, Lithuania.  pp.123-128,  2000.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4318
4.

Conference Proceedings

Conference Proceedings
Monemar,B. ; Bergman,J.P. ; Ivanov,I.G. ; Baranowski,J.M. ; Pakula,K. ; Grzegory,I. ; Porowski,S.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1275-1278,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
5.

Conference Proceedings

Conference Proceedings
Korona,K.P. ; Bergman,J.P. ; Monemar,B. ; Baranowski,J.M. ; Pakula,K. ; Grzegory,I. ; Porowski,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1125-1130,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Perlin,P. ; Suski,T. ; Teisseyre,H. ; Leszczynski,M. ; Grzegory,I. ; Jun,J. ; Bockowski,M. ; Porowski,S. ; Boguslawski,P. ; Bernholc,J. ; Moustakas,T.D.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.23-24,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
7.

Conference Proceedings

Conference Proceedings
Teisseyre,H. ; Suski,T. ; Perlin,P. ; Gorczyca,I. ; Leszczynsk,M. ; Grzegory,I. ; Jun,J. ; Porowski,S.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.43-48,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
8.

Conference Proceedings

Conference Proceedings
Wetzel,C. ; Walukiewicz,W. ; Haller,E.E. ; Ager,J.W.III ; Chen,A. ; Fischer,S. ; Yu,P.Y. ; Jeanloz,R. ; Grzegory,I. ; Porowski,S. ; Suski,T. ; Amano,H. ; Akasaki,I.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.31-36,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
9.

Conference Proceedings

Conference Proceedings
Turos,A. ; Nowicki,L. ; Stonert,A. ; Leszczynski,M. ; Grzegory,I. ; Porowski,S.
Pub. info.: Materials science applications of ion beam techniques : proceedings of the International Symposium on Materials Science Applications of Ion Beam Techniques, incoeporating the 1st German-Australian Workshop on Ion Beam Analysis, Seeheim, Germany, September 9-12 1996.  pp.419-423,  1997.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 248-249