1.

Conference Proceedings

Conference Proceedings
Bosse,L. ; Gillner,A. ; Poprawe,R.
Pub. info.: In-line characterization, yield, reliability, and failure analysis in microelectronic manufacturing II : 31 May-1 June 2001, Edinburgh, UK.  pp.76-81,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4406
2.

Conference Proceedings

Conference Proceedings
Horn,A. ; Weichenhain,R. ; Kreutz,E.W. ; Poprawe,R.
Pub. info.: XIII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 18-22 September 2000.  pp.539-544,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4184
3.

Conference Proceedings

Conference Proceedings
Jandeleit,J. ; Wiedmann,N. ; Loosen,P. ; Poprawe,R.
Pub. info.: Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California.  pp.217-221,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3626
4.

Conference Proceedings

Conference Proceedings
Hellrung,D. ; Yeh,L.-Y. ; Depiereux,F. ; Gillner,A. ; Poprawe,R.
Pub. info.: Laser applications in microelectronic and optoelectronic manufacturing IV : 25-27 January 1999, San Jose, California.  pp.348-356,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3618
5.

Conference Proceedings

Conference Proceedings
Schmidt,G. ; Wester,R. ; Hoffmann,H.D. ; Bonati,G. ; Loosen,P. ; Poprawe,R.
Pub. info.: Solid state lasers VIII : 25-26 January 1999, San Jose, California.  pp.8-15,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3613
6.

Conference Proceedings

Conference Proceedings
Henning,T. ; Habich,U. ; Poprawe,R.
Pub. info.: Laser resonators II : 27-29 January 1999, San Jose, California.  pp.80-89,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3611
7.

Conference Proceedings

Conference Proceedings
Jandeleit,J. ; Wiedmann,N. ; Ostlender,A. ; Brandenburg,W. ; Loosen,P. ; Poprawe,R.
Pub. info.: Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore.  pp.65-70,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3896
8.

Conference Proceedings

Conference Proceedings
Ebert,T. ; Biesenbach,J. ; Treusch,H.-G. ; Loosen,P. ; Poprawe,R.
Pub. info.: Lasers in material processing : 16-20 June, 1997, Munich, FRG.  pp.578-582,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3097
9.

Conference Proceedings

Conference Proceedings
Kaierle,S. ; Furst,B. ; Kittel,J. ; Kreutz,E.W. ; Poprawe,R.
Pub. info.: Intelligent systems in design and manufacturing.  pp.148-159,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3833
10.

Conference Proceedings

Conference Proceedings
Jandeleit,J. ; Wiedmann,N. ; Ostlender,A. ; Brandenburg,W. ; Loosen,P. ; Poprawe,R.
Pub. info.: Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California.  pp.270-277,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3945