Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width

Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width

Author(s):

Korchevskii, V. V. ( Khabarovsk State Univ. of Technology (Russia) )
Klepikov, S. I. ( Khabarovsk State Univ. of Technology (Russia) )
Popova, L. M. ( Khabarovsk State Univ. of Technology (Russia) )

Publication title:

Fundamental problems of optoelectronics and microelectronics II : 13-16 September, 2004, Khabarovsk, Russia

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5851

Pub. Year:

2005

Page(from):

190

Page(to):

193

Pages:

4

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458483 [0819458481]

Language:

English

Call no.:

P63600/5851

Type:

Conference Proceedings

Details

TDL ID:	ZA00015085
Series ID:	PA00000029
Conf. info. (Name):	Fundamental problems of optoelectronics and microelectronics
Conf. info. (Number):	2004 : 2nd
Conf. info. (Venue):	Khabarovsk, Russia
Conf. info. (Date):	2004.09.13-2004.09.16

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