1.

Conference Proceedings

Conference Proceedings
Podor,B.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.102-111,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
2.

Conference Proceedings

Conference Proceedings
Horvath,Zs.J. ; Makhniy,V.P. ; Reti,I. ; Demych,M.V. ; Tuyen,V.Van ; Gorley,P.M. ; Balazs,J. ; Ulyanitsky,K.S. ; Dozsa,L. ; Horley,P.P. ; Podor,B.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.258-261,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
3.

Conference Proceedings

Conference Proceedings
Podor,B.
Pub. info.: International Conference on Solid State Crystals 2000: Growth, Characterization, and Applications of Single Crystals.  4412  pp.299-303,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4412
4.

Conference Proceedings

Conference Proceedings
Horvath,Zs.J. ; Podor,B. ; Frigeri,P. ; Franchi,S. ; Gombia,E. ; Mosca,R. ; Tuyen,V.Van ; Dozsa,L.
Pub. info.: International Conference on Solid State Crystals 2000 : Epilayers and Heterostructures in Optoelectronics and Semiconductor Technology, 9-13 October, 2000, Zakopane, Poland.  4413  pp.153-156,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4413
5.

Conference Proceedings

Conference Proceedings
Podor,B. ; Venger,E.F. ; Kryshtab,T.G. ; Semenova,G.N. ; Lytvyn,P.M. ; Semtsiv,M.P.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.197-201,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
6.

Conference Proceedings

Conference Proceedings
Podor,B. ; Savel'ev,I. G. ; loffe A. F. ; Kovacs,Gy. ; Remenyi,G. ; Gombos,G. ; Kreshchuk,A.M. ; Novikov,S. V.
Pub. info.: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.46-50,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3182
7.

Conference Proceedings

Conference Proceedings
Podor,B. ; Vignaud,D. ; Tiginyanu,I. M. ; Csontos,L. ; Ursaki,V. V. ; Shontya,V. P.
Pub. info.: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.142-145,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3182