1.

Conference Proceedings
Conference Proceedings
1. Positron Annihilation Spectroscopy of the Native Vacancies in As-Grown GaAs
Corbel,C. ; Pierre,F. ; Hautojarvi,P. ; Saarinen,K. ; Moser,P.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part2  pp.791-796,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings
Conference Proceedings
2. Positron annihilation in electron irradiated gallium arsenide:atomic structure and charge states of the defects
Corbel,C. ; Pierre,F. ; Hautojarvi,P. ; Saarinen,K. ; Moser,P.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.979-984,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Residual stress,composition,and optical properties of SiOxNy thin films deposited by dual ion beam sputtering
Robic,J.Y. ; Leplan,H. ; Berger,M. ; Chaton,P. ; Quesnel,E. ; Lartigue,O. ; Pelle,C. ; Pauleau,Y. ; Pierre,F.
Pub. info.: Developments in optical component coatings : 15-16 May, 1996, Glasgow, Scotland, UK.  pp.381-391,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2776
4.

Conference Proceedings
Conference Proceedings
4. Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes
Quesnel,E. ; Berger,M. ; Cigna,J. ; Duca,D. ; Pelle,C. ; Pierre,F.
Pub. info.: Developments in optical component coatings : 15-16 May, 1996, Glasgow, Scotland, UK.  pp.366-372,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2776
5.

Conference Proceedings
Conference Proceedings
5. Deep discrete trenches filled by in-situ doped polysilicon:an alternative method for junction insulating box
Pierre,F. ; Aachboun,S. ; Bonnaud,O. ; Lhermite,H. ; Ranson,P. ; Anceau,Ch. ; Cornibert,L.
Pub. info.: Microelectronic Device Technology III.  pp.252-258,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3881