1.

Conference Proceedings
Conference Proceedings
1. At-wavelength characterization of DUV-radiation-induced damage in fused silica
Lee,S.H. ; Piao,F. ; Naulleau,P. ; Goldberg,K.A. ; Gldharn,W.G. ; Bokor,J.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.724-731,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
2.

Conference Proceedings
Conference Proceedings
2. Material limitations to 193-nm lithographic system lifetimes
Schenker,R.E. ; Piao,F. ; Oldham,W.G.
Pub. info.: Optical Microlithography IX.  Part2  pp.698-706,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2726
3.

Conference Proceedings
Conference Proceedings
3. Temperature dependence of UV-induced compaction in fused silica
Piao,F. ; Schenker,R.E. ; Oldham,W.G.
Pub. info.: Optical Microlithography X.  pp.907-912,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3051
4.

Conference Proceedings
Conference Proceedings
4. Durability of experimental fused silicas to 193-nm induced compaction
Schenker,R.E. ; Piao,F. ; Oldham,W.G.
Pub. info.: Optical Microlithography X.  pp.44-53,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3051