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9 results

1.

Conference Proceedings

1. A method for the determination of weight factors for quantitative phase analysis using dual phase starting powders with application to α/βsilicon nitride

Pfeiffer,W. ; Schulze,M.

Pub. info.:	EPDIC 2 : proceedings of the Second European Powder Diffraction Conference, held, July 30 - August 1, 1992, in Enschede, The Netherlands. Pt.1 pp.45-50, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	133-136

2.

Conference Proceedings

2. Optimised homogeneity and stability of gas discharges in fast-flow CO2 laser systems operating at the choking limit

Pfeiffer,W. ; Schmitz,C. ; Giesen,A. ; Hugel,H.

Pub. info.:	XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 25-30 August 1996, Heriot-Watt University, Edinburgh, UK. pp.227-230, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3092

3.

Conference Proceedings

3. Radioactive Isotopes in Photoluminescence Experiments:Identification of Defect Levels

Magerle,R. ; Burchard,A. ; Kerle,T. ; Pfeiffer,W. ; Deicher,M.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1503-1508, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

4.

Conference Proceedings

4. Doping of ZnSe,ZnTe and CdTe with Group V Elements

Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.309-314, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

5.

Conference Proceedings

5. Study of Indium Implanted GaAs:Positron Annihilation and Electrical Measurements

Pfeiffer,W. ; Liszkay,L. ; Burchard,A. ; Deicher,M. ; Magerle,R. ; Ronning,C. ; Saarinen,K. ; Hautojarvi,P.

Pub. info.:	Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.305-310, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	143-147

6.

Conference Proceedings

6. Spectroscopy of Hydrogen-Related Defects in III-V Semiconductors by Nuclear Techniques

Deicher,M. ; Pfeiffer,W.

Pub. info.:	Hydrogen in compound semiconductors. pp.481-500, 1994. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	148-149

7.

Conference Proceedings

7. Acceptor-Hydrogen Interaction in Ternary III-V Semiconductors

Burchard,A. ; Deicher,M. ; Forkel-Wirth,D. ; Freidinger,J. ; Kerle,T. ; Magerle,R. ; Pfeiffer,W. ; Prost,W. ; Wellmann,P. ; Winnacker,A.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.987-991, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

8.

Conference Proceedings

8. Optimisation of power deposition in rf-excited CO2 lasers by adding gas additives to the laser gas mixtures

Schmitz,C. ; Pfeiffer,W. ; Giesen,A. ; Hugel,H.

Pub. info.:	XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference : 25-30 August 1996, Heriot-Watt University, Edinburgh, UK. pp.190-193, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3092

9.

Conference Proceedings

9. Optimization of laser active media for fast-flowing gas lasers

Pfeiffer,W. ; Schmitz,C. ; Giesen,A. ; Hugel,H.

Pub. info.:	XII International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference. pp.209-212, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3574

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