Stevie, F.A. ; Persson, E. ; DeBusk, D.K. ; Savchuk, A. ; Hoff, A.M. ; Edelman, P. ; Lagowski, J.
Pub. info.:
Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.357-364, 1997. Pennington, NJ. Electrochemical Society
Jastrzebski, L. ; Henley, W. ; DeBusk, D. ; Haddad, N. ; Lowell, J. ; Wenner, V. ; Nauka, K. ; Persson, E.
Pub. info.:
Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing. pp.530-536, 1994. Pennington, NJ. Electrochemical Society
Edelman, P. ; Lagowski, J. ; Savchouk, A. ; Hoff, A. ; Jastrzebski, L. ; Persson, E.
Pub. info.:
Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.443-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Osip, D. J. ; Phillips, M. M. ; Bernstein, R. ; Burley, G. ; Dressler, A. ; Elliot, J. L. ; Persson, E. ; Shectman, S. A. ; Thompson, I.
Pub. info.:
Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.49-59, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering