1.

Conference Proceedings
Conference Proceedings
1. Donor Concentration Dependence of GaP Luminescence
Monteiro,T. ; Pereira,E. ; Dominguez-Adame,F. ; Piqueras,J.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.375-380,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
2.

Conference Proceedings
Conference Proceedings
2. Study of defects in diamond films by electrical measurements
Pereira,L. ; Pereira,E. ; Gomes,H.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.793-798,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Time Resolved Photoluminescence and Optically Detected Magnetic Resonance Investigations on Synthetic Diamond
Pereira,E. ; Santos,L. ; Pereira,L.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.57-62,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
4.

Conference Proceedings
Conference Proceedings
4. Blue emission in Mg doped CaN studied by time-resolved spectroscopy
Seitz,R. ; Gaspar,C. ; Monteiro,T. ; Pereira,E. ; Leroux,M. ; Beaumont,B. ; Gibart,P.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1155-1160,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings
Conference Proceedings
5. Ni Related Centers in Synthetic Diamond
Hofmann,D.M. ; Christmann,P. ; Volm,D. ; Pressel,K. ; Pereira,L. ; Santos,L. ; Pereira,E.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.79-84,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201