Color science and imaging technologies : 16-17 October, 2002, Shanghai, China. pp.167-170, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Peng, B. ; Espinosa, H. D. ; Moldovan, N. ; Xiao, X. ; Auciello, O. ; Carlisle, J. A. ; Gruen, D. M. ; Divan, R. S. ; Mancini, D. C. ; Gerbi, J. E. ; Birrell, J.
Pub. info.:
Mechanical properties derived from nanostructuring materials : symposium held April 22-25, 2003, San Francisco, California, U.S.A.. pp.49-56, 2003. Warrendale, Pa.. Materials Research Society
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3741-3744, 2005. Uetikon-Zuerich. Trans Tech Publications
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China. pp.3757-3760, 2005. Uetikon-Zuerich. Trans Tech Publications
Espinosa, H.D. ; Peng, B. ; Kim, K.-H. ; Prorok, B.C. ; Moldovan, N. ; Xiao, X.C. ; Gerbi, J.E. ; Birrell, J. ; Auciello, O. ; Carlisle, J.A. ; Gruen, D.M. ; Mancini, D.C.
Pub. info.:
Nano- and microelectromechanical systems (NEMS and MEMS) and molecular machines : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A.. pp.213-218, 2003. Warrendale, Pa.. Materials Research Society
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China. pp.345-350, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Thin films : stresses and mechanical properties X : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.159-166, 2002. Warrendale, Pa.. Materials Research Society
Su, Y. ; Roddis, N. ; Nan, R. D. ; Peng, B. ; Zhou, J. F.
Pub. info.:
Ground-based telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.903-912, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering