Blank Cover Image

Temperature dependence of drain-induced barrier lowering in fully depleted SOI MOSFETs

Author(s):
Publication title:
Proceedings of the Seventh International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
96-3
Pub. Year:
1995
Page(from):
287
Page(to):
291
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771535 [1566771536]
Language:
English
Call no.:
E23400/962142
Type:
Conference Proceedings

Similar Items:

Jomaah, J, Ghibaudo, G, Balestra, F

Electrochemical Society

Renn, S.H., Pauly, E., Pelloie, J.L., Balestra, F.

Electrochemical Society

Jomaah, J., Ghibaudo, G., Balestra, F.

Electrochemical Society

Pelloie, J.L., Sun, Y.S.

Electrochemical Society

J. Jomaah, F. Balestra, G. Ghibaudo

Electrochemical Society

Dimitrakis, P., Balestra, J. Jomaah. F., Papajoannon, G.J.

Electrochemical Society

Jomaah, J., Balestra, F., Ghibaudo, G.

Electrochemical Society

A. Emrani, G. Ghibaudo, F. Balestra

Electrochemical Society

Renn, S.H., Pelloie, J.L., Balestra, F.

Electrochemical Society

Jomaah, J., Balestra, F.

Kluwer Academic Publishers

J. Jomaah, G. Ghibaudo, S. Cristoloveanu, A. Vandooren, F. Dieudonné, J. Pretet, F. Lime, K. Oshima, B. Guillaumot, F. …

Electrochemical Society

Jomaah, J., Balestra, F.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12