1.

Conference Proceedings

Conference Proceedings
Peka,P. ; Lehr,M.U. ; Dziesiaty,J. ; Muller,S. ; Kreissl,J. ; Rudolph,P. ; Schulz,H.-J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.435-440,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Kreissl,J. ; Irmscher,K. ; Peka,P. ; Lehr,M.U. ; Schulz,H.-J. ; Pohl,U.W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.773-778,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings

Conference Proceedings
Selber,H.R. ; Peka,P. ; Schuiz,H.J. ; Pohl,U.W. ; Kreissl,J. ; Kaufmann,B. ; Dornen,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1401-1406,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263