1.

Conference Proceedings

Conference Proceedings
Boehringer, M. ; Hauber, J. ; Passefort, S. ; Eason, K.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.42-49,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
2.

Conference Proceedings

Conference Proceedings
De Witte, H. ; Passefort, S. ; Besling, W. ; Maes, J.W.H. ; Eason, K. ; Youngand, E. ; Heyns, M.
Pub. info.: Rapid thermal and other short-time processing technologies III : proceedings of the international symposium.  pp.153-162,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-11
3.

Conference Proceedings

Conference Proceedings
Bohringer, M. ; Hauber, J. ; Passefort, S. ; Eason, K.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.42-49,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3