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Conference Proceedings

1. *STRUCTURAL PERFECTION OF InGaAs/InP SUPERLATTICES GROWN BY GAS SOURCE MOLECULAR BEAM EPITAXY: A HIGH-RESOLUTION X-RAY DIFFRACTION STUDY

vanderberg, J. M. ; Panish, M. B. ; Hamm,. R. A.

Pub. info.:	Multilayers : synthesis, properties, and non-electronic applications : symposium held December 2-4, 1987, Boston, Massachusetts, U.S.A.. pp.79-102, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	103

Conference Proceedings

2. *HIGH QUALITY EPITAXIAL GROWTH ON IN-SITU PATTERNED InP SUBSTRATE

Temkin, H. ; Harriott, L. R. ; Weiner, J. ; Hamm, R. A. ; Panish, M. B.

Pub. info.:	III-V heterostructures for electronic/photonic devices : symposium held April 24-27, 1989, San Diego, California, U.S.A.. pp.39-46, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	145

Conference Proceedings

3. DYNAMICAL X-RAY DIFFRACTION STUDIES OF INTERFACIAL STRAIN IN SUPERLATTICES GROWN BY MOLECULAR BEAM EPITAXY

Vanderberg, J. M. ; Chu, S. N. G. ; Hamm, R. A. ; Panish, M. B. ; Ritter, D. ; Mancrander, A. T.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.141-146, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

4. EVOLUTION OF ROUGHNESS ON InP LAYERS OBSERVED BY SCANNING FORCE MICROSCOPY

Cotta, M. A. ; Hamm, R. A. ; Chu, S. N. G. ; Staley, T. W. ; Harriott, L. R. ; Panish, M. B. ; Temkin, H.

Pub. info.:	Common themes and mechanisms of epitaxial growth : symposium held April 13-15, 1993, San Francisco, California, U.S.A.. pp.23-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	312