1.

Conference Proceedings

Conference Proceedings
Chow, Y.F. ; Foo, T.H. ; Shen, L. ; Pan, J.S. ; Du, A. Y. ; Xing, Z.X. ; Yuan, Y.J. ; Li, C.Y. ; Kumar, R. ; Foo, P.D.
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.563-568,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
2.

Conference Proceedings

Conference Proceedings
Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Chai, J.W. ; Zhang, J.H.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D9.18-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
3.

Conference Proceedings

Conference Proceedings
Li, A.C.F. ; Pan, J.S. ; Lai, H.C. ; Lee, B.L. ; Wu, J.H. ; Lin, Y.S. ; Huo, T.C. ; Wu, C.C. ; Huang, K.F.
Pub. info.: Vertical-Cavity Surface-Emitting Lasers VII.  pp.12-20,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4994
4.

Conference Proceedings

Conference Proceedings
Lai, H.C. ; Pan, J.S. ; Li, A.C.F. ; Tang, M.C. ; Wu, C.C. ; Lee, T.D. ; Huang, K.F.
Pub. info.: Materials, Active Devices, and Optical Amplifiers.  pp.541-548,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5280