Padilla-Sosa, P. ; Funes-Gallanzi, M. ; Berriel-Valdos, L. R. ; Guerrero-Viramontes, A. ; Hernandez, D. Moreno
Pub. info.:
Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.163-167, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering