Characterization of the Structural and Electrical Properties of Ion Beam Sputtered ZnO Films

Characterization of the Structural and Electrical Properties of Ion Beam Sputtered ZnO Films

Author(s):

Publication title:

Advanced materials and nanotechnology : selected, peer reviewed papers from the 5th Biennial Conference on Advanced Materials and Nanotechnology (AMN-5), February 7-11, 2011, Wellington, New Zealand

Title of ser.:

Materials science forum

Ser. no.:

700

Pub. Year:

2012

Page(from):

49

Page(to):

52

Pages:

4

Pub. info.:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00054196
Series ID:	PA00000012
Conf. info. (Name):	Biennial Conference on Advanced Materials and Nanotechnology (AMN-5)
Conf. info. (Number):	5th
Conf. info. (Venue):	Wellington, New Zealand
Conf. info. (Date):	2011.02.07-2011.02.11
Note for article:	5th Biennial Conference on Advanced Materials and Nanotechnology (AMN-5), February 7-11, 2011, Wellington, New Zealand

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